Reltech Dursley semiconductor reliability laboratory
ReltechDursley, Gloucestershire
Reltech provides semiconductor reliability and qualification testing at Cam Mills, Lower Cam, Dursley. UKAS register 2806 and schedule issue 017 dated 11 September 2025 confirm the exact site. The retained scope covers high and low temperature tests, temperature cycling, temperature/humidity bias and DC operation or measurement. Separate chamber limits and method conditions apply. The wider owner portfolio is not treated as wholly accredited.
Reviewed by Arc · About this review
Key facts
- Exact laboratory site
- Reltech, Cam Mills, Lower Cam, Dursley, Gloucestershire GL11 5PW. Schedule 2806 states testing at this address only.
- Products and scope
- The schedule covers non-explosive electrical and electronic components, including solid-state and semiconductor devices. AEC-Q100 Rev J is covered only to the extent of the listed JEDEC tests.
- Published enquiry
- Use sales@reltech.co.uk, +44 1453 541200 or the owner’s contact form. Paul Tuffin is the schedule-listed contact without a verified current job title.
Testing capabilities
High and low temperature semiconductor tests
The Cam Mills schedule lists high/low temperature storage and operating-life or bias tests with specified JEDEC references. The high and low chambers have separate published limits. Exact test condition and device operation must be agreed.
Temperature cycling
The Cam Mills schedule lists temperature cycling to JESD22-A104F.01, April 2023, with specified conditions. Published chamber dimensions are retained, while ambiguous endpoint labels require confirmation.
Temperature and humidity bias
The Cam Mills schedule lists steady-state temperature humidity bias life testing to JESD22-A101D.01, January 2021, at +85 °C and 85% RH.
Electrical operation and DC measurement
The Cam Mills schedule lists electrical operation and measurement from 200 mV to 1,000 V DC using documented in-house methods and customer-specified requirements.
Equipment and published limits
| Specification | Published value | Conditions |
|---|---|---|
| High temperature chamber | Maximum +200 °C, maximum chamber 0.36 m × 0.8 m × 0.45 m | High/low temperature row. This upper limit and chamber are separate from the low temperature chamber. Individual storage/life/bias conditions apply. |
| Low temperature chamber | Minimum -40 °C, maximum chamber 0.46 m × 0.60 m × 0.60 m | High/low temperature row, distinct from the +200 °C chamber. Confirm the exact storage or operating-life condition. |
| Temperature cycling chamber | Maximum chamber 0.32 m × 0.23 m × 0.48 m | JESD22-A104F.01, April 2023. Both source endpoints are labelled Max Temp, so both temperature values are omitted pending confirmation. |
| Temperature/humidity bias condition | +85 °C and 85% RH, maximum chamber 0.6 m × 0.6 m × 0.6 m | Specific steady-state THB condition under JESD22-A101D.01, January 2021. It is not a general combined temperature/humidity range. |
| DC operation and measurement | 200 mV to 1,000 V DC | Documented in-house methods and customer requirements. This is a measurement/operation range, without a power or item-capacity claim. |
Access and contact
The owner invites service enquiries through +44 1453 541200 and its contact form. The schedule publishes sales@reltech.co.uk and lists Paul Tuffin as contact, without a verified current role. Agree the device or package, test method and edition, operating/bias condition, hardware, sample plan, reporting and programme with Reltech. No current slot or unrestricted access is verified.
Facility contact
- Address
- Cam Mills, Lower Cam
Dursley, Gloucestershire, GL11 5PW
United Kingdom - sales@reltech.co.uk
- Telephone
- +44 1453 541200
- Website
- Official test house website
Standards and accreditation
- UKAS 2806 and ISO/IEC 17025:2017
- The current register lists Reltech at Cam Mills. Retrieved schedule 2806 issue 017 is dated 11 September 2025 and restricts testing to that site. Page 1 prints ISO/IEC 17025:2017. Page 2 has an original header typo, retained in the evidence.
- Exact JEDEC and limited AEC scope
- The schedule names JESD22-A103E.1, July 2021, JESD22-A108G, November 2022, JESD22-A119, October 2015, JESD22-A104F.01, April 2023 and JESD22-A101D.01, January 2021. AEC-Q100 Rev J applies only to the extent covered by the listed JEDEC tests. Exact row conditions and required report need confirmation.
- Owner portfolio versus accredited methods
- Reltech advertises a wider semiconductor qualification portfolio. HAST, ESD, ATE and failure analysis statements on the owner page do not establish that all those methods are in schedule 2806. Manufactured systems and wider qualification outcomes are not laboratory-wide accredited limits.
What to confirm with the facility
- The schedule prints Max Temp for both temperature-cycling endpoints. This guide omits both values and retains the method and chamber dimensions. Confirm the exact cycling temperatures and conditions directly.
- High and low temperature chamber dimensions belong to separate published limits. THB uses its own +85 °C and 85% RH condition. Do not combine these into one operating envelope or infer a test item’s capacity from chamber dimensions.
- Provide device/package type, sample quantity, dimensions, sockets or boards, operating and bias requirements, target standard, acceptance criteria and reporting needs.
Before requesting a test
Public information not available. Contact test facility provider for more information.
Frequently asked questions
Public information not available. Contact test facility provider for more information.
Related testing facilities
Public information not available. Contact test facility provider for more information.
Further reading
Public information not available. Contact test facility provider for more information.
Sources and review
Reviewed by Arc on 1 October 2026 in Europe/London using six fresh official captures. Current owner/contact/testing pages and q=Reltech register confirm exact Cam Mills identity and enquiry. Owner-linked and register-linked UKAS schedules return identical original bytes, with both complete page sets extracted, rendered and visually inspected. Issue 017 is dated 11 September 2025, while original PDF creation/modification are 17 September 2025. Page 1 establishes ISO/IEC 17025:2017. Page 2’s original accreditation-header typo and duplicate Max Temp cycling labels are preserved, with both cycling temperature endpoints omitted. Separate high/low chambers, exact THB condition, DC measurement range and JEDEC references are mapped, with limited AEC coverage. Wider owner methods are not blanket accredited and imported generic shock/vibration claims are cleared. Paul Tuffin remains schedule-listed contact without a current Managing Director claim. Original titles, canonicals, publisher dates, body/header/retrieval records and inspections are retained. The prior homepage differs in raw bytes but full normalised visible text and publisher metadata agree, without all-link equality. Historical sidebar/personnel dates and copyright are separate from review. Inherited coordinates are cleared.
Arc publishes this directory entry and does not operate the test facility. Suggest a correction to Arc with a supporting source.
Owner identifies an independent laboratory for semiconductor and microelectronics reliability and qualification. Exact current contact and UKAS schedule are checked separately. Broader advertised qualification, HAST, HALT and manufactured systems are not blanket accredited site limits.
Current contact page lists Reltech, Cam Mills, Lower Cam, Dursley, Gloucestershire GL11 5PW, telephone and form. Schedule sales email is used separately. Fax and historical/sidebar personnel are not current role evidence.
Reltech offer Semiconductor Qualification Testing
Owner publishes device/package qualification and a wider list including HAST, ESD, ATE and failure analysis. These are advertised portfolio statements, not all within UKAS 2806. Exact current linked schedule controls the retained accredited scope.
Search UKAS accredited organisations
q=Reltech lists Reltech, Testing Laboratories 2806, exact Cam Mills address and linked schedule. Template dates are not this result’s issue/update dates. Protected email is not decoded.
Current owner-linked UKAS 2806 schedule issue 017 confines listed methods to Cam Mills. Both complete pages inspected. Distinct high/low chambers and THB/DC conditions retained. Page 2 duplicate Max Temp cycling endpoints are omitted, original header typo retained. No all-portfolio accreditation or manufactured-system capacity inferred.
Register-linked download returns the same original PDF bytes as the owner-linked schedule. Its own body/headers/retrieval, extraction, two complete page images and rendering provenance retained. Exact schedule scope, original typos and omissions are identical.